Tech Breakthrough: LANYI Electronics Granted Patent for Automated Optical Inspection (AOI) Technology, Dramatically Enhancing Testing Efficiency_Dongguan Lanyi Electronic Technology Co., Ltd.

Independent research and development of non-magnetic probe, non-stick tin probe has been successfully used in aviation, military, medical and other industries, has become the core components of modern high-tech electronic products. The products are mainly used in the testing of various electronic and peripheral products, such as semiconductor components, CPU chips, PCB circuit boards, LCD screens, Camera cameras, IOT. Online testing of Internet of Things cars and other peripheral electronic products.

Tech Breakthrough: LANYI Electronics Granted Patent for Automated Optical Inspection (AOI) Technology, Dramatically Enhancing Testing Efficiency

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LANYI Electronics Marketing Department

DONGGUAN, China – March 19, 2025 – According to the latest disclosure from the China National Intellectual Property Administration (CNIPA), Dongguan LANYI Electronics Technology Co., Ltd. has been officially granted a patent for its self-developed "Probe Automatic Optical Inspection (AOI) Machine" (Authorized Announcement No.: CN222625414U). This patent marks a major milestone for LANYI Electronics in the field of automated inspection for semiconductor test probes.

Addressing the Bottlenecks of Precision Testing

Semiconductor test probes are ultra-precision electronic components that have traditionally relied on manual visual inspection. This conventional method is often limited by low efficiency and human error, which can hinder large-scale production.

LANYI's newly patented AOI system revolutionizes this process by utilizing a vibrating tray for automated feeding, multi-angle optical dimension measurement, and advanced surface defect detection. The result is a fully automated, high-speed inspection pipeline.

Core Technical Advantages:

360-Degree Comprehensive Coverage: The system performs precise captures of the probe's sides, the top at a 45-degree angle, and the bottom. This ensures that dimensional variances and surface defects are identified with total accuracy.
Enhanced Efficiency & Cost Reduction: By significantly shortening inspection cycles and increasing precision, the system effectively reduces labor costs and accelerates the integration of AI with automated manufacturing.

Strengthening Full-Chain R&D and Production

The approval of this patent further solidifies LANYI Electronics' full-chain self-development capabilities—spanning probe R&D, manufacturing, and quality control. This technological moat provides a solid foundation for achieving high-volume, high-quality mass production for the global semiconductor market.

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