台易电子半导体测试探针-生产企业

台易电子半导体测试探针-生产企业

顾客至上 品质为本 团结合作 互利共赢

自主研发无磁探针,不粘锡探针已成功应用于航空军工医疗等行业,已成为现代化高科技电子产品核心部件。产品主要应用于各类电子及其周边产品的测试如:半导体元器件、CPU芯片、PCB电路板、LCD屏幕、Camera摄像头、IOT.物联网汽车,及其它周边电子产品的在线测试。

10 years +

Working Experience

100 Desk +

Production Equipment

2 Million +

Probe Capacity

150 People+

Practitioner

One-stop test solution

One-stop Test Solution

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Fine probe

At present, Lanyi can produce probe with 100um outer diameter, which can satisfy customers' smaller measurement spacing.

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Kelvin probe

The Kelvin probe developed by Lanyi can meet the requirements of testing and measuring inductive reactance and capacitive reactance in electrical measuring systems.

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Double-ended test probe

The double - head probe developed by Lanyi is widely used in camera module.

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High frequency fixture

Lanyi has domestic and foreign engineering teams to solve high frequency test solutions for customers, the maximum can achieve 40GHZ high frequency.

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Test fixture

Lanyi can provide customers with customized QFN,BGA,QFP,CSP and other packaging test fixtures.

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Camera module

Mature camera module fixture, for customers to solve different camera testing requirements.

Semiconductor high-frequency test probe

Semiconductor high-frequency test probe

Double-ended test probe

Double-ended test probe

ICT online test probe sleeve

ICT online test probe sleeve

ICT online test probe

ICT online test probe

Interface through test probe

Interface through test probe

Common PCB spring test probe

Common PCB spring test probe

Automotive battery high current probe

Automotive battery high current probe

Automotive electronic wiring harness probe

Automotive electronic wiring harness probe

Consumer electronics charging probe

Consumer electronics charging probe

Signal transmission RF probe

Signal transmission RF probe


Semiconductor high-frequency test probe

Mainly used for semiconductor wafer testing, chip packaging testing. With extremely low contact resistance and ultra-high bandwidth, it can meet the test probe requirements of 5 to 40GHZ RF.

Double-ended test probe

Used for BGA packaging, LGA packaging, QFP packaging, SOP packaging, QFN packaging, testing probe.

ICT online test probe sleeve

Mainly fixed on PCB board, and ICT online test probe for supporting use. It is convenient for customers to replace the test probe more conveniently.

ICT online test probe

Also known as ICT/FCT test probe, mainly used for online circuit testing and functional testing. It is a kind of probe which can detect the electrical performance and circuit network connection of on-line components on the fabricated board. It can quantitatively measure the line selection of components and carry out functional test. It is a kind of probe which is widely used at present.

Interface through test probe

Mainly used for PCB board test, through the circuit and the resistance between the line to determine whether the circuit board is open, short circuit defect.

Common PCB spring test probe

Mainly used for PCB board test. Strong versatility, wide universality, through the line and the resistance or capacitance between the line to judge the line conduction and other defects.

Automotive battery high current probe

The probe is used to test the function of automobile batteries, and is also used to test the voltage and current of power batteries.

Automotive electronic wiring harness probe

The probe is connected to the harness and is used to check the function of the automobile electronic circuit.

Consumer electronics charging probe

Also known as Pogo Pin, it is mainly used for DC power supply for long-term pressing charging of electronic products. It is used for charging smart watches, earphones and so on.

Signal transmission RF probe

It is mainly used to measure the signal transmission of router. The frequency is usually between 2.1-5.8GHZ.
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