LANYI Electronics' self-developed non-magnetic probes and non-stick tin probes have been successfully applied in aviation, military, medical, and other high-end industries, serving as core components in modern high-tech electronic products. These probes are primarily used for testing semiconductors, AI high-speed connectors, camera modules, and other electronic devices.
Mainly fixed on PCB board, and ICT online test probe for supporting use. It is convenient for customers to replace the test probe more conveniently.
View details
Also known as ICT/FCT test probe, mainly used for online circuit testing and functional testing. It is a kind of probe which can detect the electrical performance and circuit network connection of on-line components on the fabricated board. It can quantitatively measure the line selection of components and carry out functional test. It is a kind of probe which is widely used at present.
View details
Semiconductor high-frequency test probe
Mainly used for semiconductor wafer testing, chip packaging testing. With extremely low contact resistance and ultra-high bandwidth, it can meet the test probe requirements of 5 to 40GHZ RF.
View details
Mainly used for PCB board test, through the circuit and the resistance between the line to determine whether the circuit board is open, short circuit defect.
View details
Mainly used for PCB board test. Strong versatility, wide universality, through the line and the resistance or capacitance between the line to judge the line conduction and other defects.
View details
LANYI Electronics - Semiconductor Test Probe Manufacturing Plant
Customer first, quality first, unity and cooperation, mutual benefit and win-win
在线客服添加返回顶部
右侧在线客服样式 1,2,3 1
图片alt标题设置： Dongguan Lanyi Electronic Technology Co., Ltd.
表单验证提示文本： Content cannot be empty!
循环体没有内容时： Sorry,no matching items were found.
CSS / JS 文件放置地
Copyright © 2022 Dongguan LANYI Electronic Technology Co., Ltd. 粤ICP备17061266号