Independent research and development of non-magnetic probe, non-stick tin probe has been successfully used in aviation, military, medical and other industries, has become the core components of modern high-tech electronic products. The products are mainly used in the testing of various electronic and peripheral products, such as semiconductor components, CPU chips, PCB circuit boards, LCD screens, Camera cameras, IOT. Online testing of Internet of Things cars and other peripheral electronic products.

How does the probe work?



The probe is a small piece of single-stranded DNA or RNA (about 20 to 500bp) that is used to detect the complementary nucleic acid sequence. The double-stranded DNA is heated to become a single strand, which is then labeled as a probe with a radioisotope (usually phospho-32), a fluorescent dye, or an enzyme (such as horseradish peroxidase). Phosphorus-32 is usually incorporated into a phosphoric acid group, one of the four nucleotides that make up DNA, while fluorescent dyes and enzymes are covalently bound to nucleic acid sequences.


Now in the test fixture, the test probe is used as a medium, the probe is placed in the casing, the probe head contacts the object to be tested, and the outgoing wire of the other end of the casing conducts the signal out, and the signal received back is processed in the testing machine. For example, the resistor uses the current source to calculate the voltage drop at both ends of the probe, and the capacitor uses the voltage source to calculate the slope of the charging time. Probes have been widely used in the testing community because of their continuous use and low cost in the fabrication of jigs.


The test probe head type is divided into a variety of mainly because different test points need different head types, such as dip foot using multi-claw head type, test pad point using pointed head, round head or flat head, IC foot using plum head type, all rely on experienced production personnel to select according to the PCB finished parts.


Nanization is only material strengthening for the probe, not impact on the test fixture. If you are interested, impact on the test fixture should be part of the test instrument, such as AOI testing.