Independent research and development of non-magnetic probe, non-stick tin probe has been successfully used in aviation, military, medical and other industries, has become the core components of modern high-tech electronic products. The products are mainly used in the testing of various electronic and peripheral products, such as semiconductor components, CPU chips, PCB circuit boards, LCD screens, Camera cameras, IOT. Online testing of Internet of Things cars and other peripheral electronic products.

Test how often the probe needs to be replaced



Test probe is the unified name of ICT/FCT test probe, BGA probe, high frequency probe, and high current probe. No matter what kind of probe has its own life, the probe pattern generally has its own life, mainly depending on the life of the spring. So what are the factors that affect the lifetime of the test probe? Here is a brief introduction to the factors that affect the life of the test probe.


Let's talk about traditional ICT/FCT detectors. These probes typically have a lifetime of about 300.000 times, but the lifetime is usually determined by the test environment. If the test environment is poor, various impurities will enter the inner tube of the probe, causing spring damage, and the probe needs to be replaced. This is a minor replacement, and the other is a regular replacement of the probe. After a period of use, the probe needs to be replaced. If you have a high frequency probe, this is special. The high frequency probe mainly lies in the inner core of the high frequency probe, so replacing the high frequency probe usually involves replacing the inner core, which can greatly reduce the cost.


In general, the probe is smaller and shorter, so the normal probe life is close to the theoretical life given by the manufacturer. Do a good job of fixture maintenance, fixture test board cleanliness. Test the test schedule according to the probe, so that the replacement frequency of the probe is lower.