Classification of test probes
Probes can be divided into:
A. Optical circuit board test probe: circuit board test before components are not installed and only open circuit and short circuit detection probes. Most domestic probe products can replace imported products;
B. Online test probe: the detection probe after the components are installed on the PCB circuit board; the core technology of excellent products is still in the hands of foreign companies, and some domestic probe products have been successfully developed, which can replace imported probe products;
C. Microelectronics testing probes: wafer testing or chip IC testing probes, the core technology is still in the hands of foreign companies, and domestic manufacturers actively participate in research and development, but only a small part of them are successfully produced.
Main types of probes: cantilever probes and vertical probes.
Cantilever probe: Blade Type and Epoxy Type
Vertical probe: Vertical Type
1. ICT probes (ICT series Probes)
Generally, the diameter is between 2.54mm-1.27mm. There are industry standards called 100mil, 75mil, 50mil, and the more special diameter is only 0.19mm, which is mainly used for online circuit testing and functional testing. Also called ICT test and FCT test. It is also one of the most commonly used probes.
2. Interface Probes
Non-standard probes are generally custom-made for a few customers who do large-scale testing machines, such as Teradyne and Agilent. For the contact points and faces of the test table and the test fixture.
3. MicroSeries Probes
The distance between the centers of the two test points is generally 0.25mm to 0.76mm.
4. Switch Probes
A single probe of the switch probe has two currents.
5. Coaxial Probes
It is used to test high-frequency signals. There are those with a shielding ring that can be tested within 10GHz and 500MHz without a shielding ring.
6. Rotator Probes
The elasticity is generally not high, because its penetrability is inherently strong, and it is generally used for the PCBA test processed by OSP.
7. High Current Probes
The diameter of the probe is between 2.54mm-4.75mm. The maximum test current can reach 39amps.
8. Semiconductor Probes
The diameter is generally between 0.50mm-1.27mm. The bandwidth is greater than 10GHz, 50Ω characteristic.
9. Battery and Connector Contacts
Generally used to optimize the contact effect, good stability and long life.
In addition to the above types, there are temperature probes, Kelvin probes, etc., which are rarely used.
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