The products are mainly used in the testing of various electronic and peripheral products such as: semiconductor components, CPU chips, PCB circuit boards, LCD screens, Camera cameras, IOT, Internet of Things cars, and other peripheral electronic products.

Maintenance of ICT test needles

Source:

Author:


ICT test needles play a very important role in the ICT test process. Although the probe is a consumable, if it is well maintained, the increase in the life of the probe will play a certain role in cost control. How to maintain the test probe to make it last longer. Here are the five key points of probe maintenance:

1. Test environment The test environment is the main reason for the probe to be contaminated with debris. For example, there is more flux in the test environment, or there is a lot of dust in the air. Contamination on the probe needle will cause contact problems with the probe, so high standards A clean room is one of the prerequisites for the life of the probe.

2. Dust cover Many fixture manufacturers provide dust cover to prevent dirt from falling on the test needle and needle tube. Especially vacant or unused fixtures. In a vacuum fixture, dust settles around the test board and sucks directly into the test pins when using a vacuum gauge.

3. Process control When testing PCBs with more rosin, the probe will be contaminated with a lot of rosin, and it is very important to control the amount of rosin.

4. Wiping Using an anti-static brush is a safer and faster method. Metal brushes or bristle brushes may damage the needle or coating, which will adversely affect the test results.

5. The needle of the needle probe is easily contaminated by flux or rosin. It is recommended to use a soft brush to clean it. First, pull out the test probe from the fixture, bundle it together, and then soak only the needle part in the detergent for about five years. Divide, wipe with a soft brush, remove residue and dry, install and continue testing.

Keeping the test needle in a clean state is a more effective way to reduce the test failure rate.