The products are mainly used in the testing of various electronic and peripheral products such as: semiconductor components, CPU chips, PCB circuit boards, LCD screens, Camera cameras, IOT, Internet of Things cars, and other peripheral electronic products.

Introduction of multi-module two-layer test fixture

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Multi-module two-layer test fixture, mainly used for multi-module imaging, programming, calibration and other tests.

1. One jig and two or more modules can be tested at the same time, which can effectively improve the test efficiency and save the cost of the jig;

2. Each module is individually limited, and the needle plate is made into an independent structure to ensure the stability of the test;

3. The limit part of the module is made into a block structure, which is convenient for replacement and maintenance;

4. The needle seat part adopts a floating structure, which can effectively protect the probe and prolong the service life of the probe;

5. The jig includes a cover opening detection function, which can effectively prevent collision and avoid damage to the jig and the machine;

6. According to the test requirements of different machines, the fixture can be divided into two structures for LENS up or down test.

1. One jig and two or more modules can be tested at the same time, which can effectively improve the test efficiency and save the cost of the jig;

2. Each module is individually limited, and the needle plate is made into an independent structure to ensure the stability of the test;

3. The limit part of the module is made into a block structure, which is convenient for replacement and maintenance;

4. The needle seat part adopts a floating structure, which can effectively protect the probe and prolong the service life of the probe;

5. The jig includes a cover opening detection function, which can effectively prevent collision and avoid damage to the jig and the machine;

6. According to the test requirements of different machines, the fixture can be divided into two structures for LENS up or down test.