多颗模组两层测试治具简介_Dongguan Lanyi Electronic Technology Co., Ltd.

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Independent research and development of non-magnetic probe, non-stick tin probe has been successfully used in aviation, military, medical and other industries, has become the core components of modern high-tech electronic products. The products are mainly used in the testing of various electronic and peripheral products, such as semiconductor components, CPU chips, PCB circuit boards, LCD screens, Camera cameras, IOT. Online testing of Internet of Things cars and other peripheral electronic products.

多颗模组两层测试治具简介

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多颗模组两层测试治具，主要用于多颗模组的影像、烧录、标定等测试。

1.一个治具，同时放两颗或者多颗模组测试，能有效提高测试效率，节约治具成本;

2.每个模组均单独限位，针盘做成独立结构，保证测试稳定性;

3.模组限位部分做成镶块结构，方便更换维护;

4.针座部分采用浮动结构，能有效地保护探针，从而延长探针使用寿命;

5.治具包含开盖检测功能，能有效防止撞机，避免对治具及机台造成损伤;

6.根据不同机台的测试要求，治具可分为LENS朝上或者朝下测试两种结构。